Kev ntseeg siab heev thiab tus kheej tsim teeb liab hloov Diode

Lus piav qhia luv luv:

Khoom npe: Teeb liab Hloov Diode

Taw qhia: Me-cim hloov diode yog ib hom semiconductor diode, uas yog ib hom diode tshwj xeeb tsim thiab tsim rau "on" thiab "tawm" ntawm Circuit Court. Lub sij hawm xav tau rau nws hloov los ntawm mus rau tawm lossis los ntawm tawm mus yog luv dua li ntawm lub diode. Lub sij hawm los ntawm lub turn-off (high-resistance state) mus rau lub turn-on (low-resistance state) ntawm lub me-cib teeb liab switching diode yog hu ua lub sij hawm tig-on; lub sij hawm los ntawm tig-rau-tawm-tawm yog hu ua lub sij hawm rov qab los; qhov sum ntawm ob lub sij hawm yog hu ua lub sij hawm hloov. Feem ntau, lub sijhawm rov qab rov qab yog ntau dua li lub sijhawm tig, yog li tsuas yog lub sijhawm rov qab rov qab tau muab rau hauv kev siv tsis tau ntawm lub diode hloov.

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Product Detail

Saib xyuas lub sijhawm teb

Kev ntsuas ntau

Khoom cim npe

Qhov zoo ntawm YUNYI's Signal Switch Diode:

1. Tsis tshua muaj kev poob qis hauv cov huab cua thiab thaj chaw sib txawv

2. Cov nqi sib tw nrog cov qib siab zoo.

3. Kev ua haujlwm siab ntau lawm nrog lub sijhawm luv luv.

4. Diode lub zog yog optimized, tau txais txiaj ntsig los ntawm kev tiv thaiv kev tshawb fawb ntawm PN junction.

5. Pom zoo los ntawm cov qauv ntawm IATF16949, ISO14001, ISO 9001: 2005, OHSAS18001, VDA6.3, thiab lwm yam.

Txheej txheem ntawm Chip Production:

1. Mechanically Printing (Super-precise automatic wafer printing)

2. Tsis Siv Neeg Thawj-etching (Tsis Siv Neeg Etching Khoom, CPK> 1.67)

3. Tsis Siv Neeg Polarity Test (Precise Polarity Test)

4. Tsis siv neeg los ua ke (Tus kheej tsim tsis siv neeg Precise Assembly)

5. Soldering (Kev tiv thaiv nrog kev sib xyaw ntawm Nitrogen & Hydrogen Vacuum Soldering)

6. Tsis Siv Neeg Thib Ob-etching (Tsis Siv Neeg Thib Ob-etching nrog Ultra-ntshiab Dej)

7. Tsis Siv Neeg Gluing (Uniform Gluing & Precise Calculation is Realized by Automatic Precise Gluing Equipment)

8. Tsis Siv Neeg Thermal Test (tsis siv neeg xaiv los ntawm Thermal Tester)

9. Tsis Siv Neeg Test (Multifunctional Tester)

Parameters:

Lub Npe	Pob	V_RRMV	I_omA	Kuv_R mA	V_R V	V_F V	Trr ns
PAB 54DF	DFN2015-6L	410	200	1	30	0.3	—
1n4148 ua	UA-35	500	150	5	75	1	4
BAV 16 W	SIB-123	400	150	1	75	0.855 ib	6
SD103 CWJ	SIB-123	400	350	5	20	0.6	—
SD103BW	SIB-123	400	350	5	30	0.6	—
SD103 AW	SIB-123	400	350	5	40	0.6	—
1n4148 wb	SIB-123	400	250	2.5	75	1	4
BAV 19 W	SIB-123	410	200	0.1	100	1	50
BAV 20 W	SIB-123	410	200	0.15	150	1	50
BAV 21 W	SIB-123	410	200	0.2	200	1	50
PEB 0530	SIB-123	410	500	130	30	0.43 ib	—
PEB 0540	SIB-123	410	500	20	40	0.51 ib	—
MBR0520L	SIB-123	410	500	250	20	0.385 ib	—
1n4448 wb	SIB-123	500	250	5	75	0.72 ib	4
PAB 43W	SIB-123	500	200	0.5	25	1	—
1 N4148 NWS	SIB-323	200	150	2.5	75	1	4
1n4448 wb	SIB-323	200	250	2.5	75	0.72 ib	4
BAV 19 WS	SIB-323	200	200	0.1	100	1	50
BAV 20 WS	SIB-323	200	200	0.1	150	1	50
BAV 21 WS	SIB-323	200	200	0.1	200	1	50
BAT54 WS	SIB-323	200	200	2	25	0.32 ib	5
SD103 CWS	SIB-323	200	350	5	20	0.6	—
SD103BWS	SIB-323	200	350	5	30	0.6	—
SD103 AWS	SIB-323	200	350	5	40	0.6	—
SD103 BWS	SIB-323	250	100	10	25	0.8 ua	—
1n4148 wb	SIB-523	150	150	1	75	1.25	4
BAS 19	TSO-23	225	200	0.1	100	1	50
BAS 20	TSO-23	225	200	0.1	150	1	50
SIB 914	TSO-23	350	200	0.025 ib	20	0.855 ib	4
SIB 001030	TSO-23	200	10	0.2	25	0.7 ua	—
TIAB SA 4150	TSO-23	350	250	0.1	50	1	4
PAB 54	TSO-23	200	200	2	30	1	5
PAB 54A	TSO-23	200	200	2	30	1	5
PAB 54C	TSO-23	200	200	2	30	1	5
PAB 54S	TSO-23	200	200	2	30	1	5
BAV 70	TSO-23	225	200	2.5	70	1	6
PAB 99	TSO-23	225	200	2.5	70	0.855 ib	6
BAS 16	TSO-23	350	200	1	75	0.855 ib	6
TIAB SA 4148	TSO-23	350	200	2.5	75	1	4
BAS 21	TSO-23	225	200	0.1	200	1	50